Case Studies

100 nm Features on a Semiconductor Chip
The spatial resolution of SMAL allows sub-diffraction features to be resolved which would otherwise be unresolved with conventional optical microscopy.
2018
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Examining Graphene Ageing
“This work has shown the promise of using the Nanoro system to analyse graphene materials. We will continue to work together moving forward” - Dr. Andrew J. Strudwick, Graphene Engineering Innovation Centre, The University of Manchester
2019
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GEIC
Metallic Deposits in Stone
“The spatial resolution offered by SMAL has the potential to better reveal the characteristics of platinum-rich phases that are 10s to 100s of nm in size, which will help us to better understand how they form in high temperature sub-volcanic magmatic settings.” - Dr Brian O’Driscoll, Senior Lecturer in Petrology, The University of Manchester
2019
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The University Of Manchester
Graphene CVD Inspection
“This work has shown the promise of using the Nanoro system to analyse graphene materials We will continue to work together moving forward” - Dr. Andrew J. Strudwick, Graphene Engineering Innovation Centre, The University of Manchester, UK.
2019
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GEIC
Graphene Suspensions
“LIG Nanowise’s microscopes are giving us a deeper insight into a range of graphene materials and products We are excited to further explore the possibilities of their technology." - Dr Paul Wiper, Graphene Engineering, Innovation Centre,The University of Manchester, UK.
2019
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GEIC